VO2 volatile memristor analysis. a) Schematic diagram of the memristive device, which consists of two Au/Ti electrodes sandwiching a dielectric film (VO2) in a lateral device structure. b) Scanning electron microscopy (SEM) image of the VO2 device. c) Cross-sectional transmission electron microscopy (TEM) image and the elemental mapping of the materials in the system for Al, Au, Ti, V and O, respectively. d) Cross-sectional TEM image of the VO2 device. e) High-resolution TEM image of the VO2 layer. f) The diffraction pattern extracted by Fourier transform of Figure 2e. g) Current-voltage (I-V) characteristics of the device repeated for 100 cycles. h) Simulated I–V curves from the thermodynamic simulation. The right area of figure show heat distribution at each moment.